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MD Notes 4 - Minority Carrier Behavior

Minority Carrier’s Behavior#

Relaxation to Equilibrium State#

The equilibrium state in a semiconductor with no net current is always being disturbed by sudden generation of excess carriers, and the system always relaxes back by recombination.

In other words, the generation and recombination of minority carrier should cancels out each other:

δnδt=Δnτn\frac{\delta n}{\delta t} = -\frac{\Delta n}{\tau_n}

for p-type, where Δn\Delta n is the excess electron density, τ\tau is the minority carrier lifetime.

It means that the decrease rate of electrons is the ratio of excess electron density to the average time that an excess electron survives.

Since the dominant process of recombination in through R-G centers, τn\tau_n and τp\tau_p depend on the density of deep traps (深能级杂质).

τ\tau is the characteristic constant of indirect R-G.

Continuity Equations (universal)#

Given an element volume of semiconductor:

Adx(δnδt)=1qA(JN(x)J(x+dx))ΔnτnAdxAdx\left( {\frac{{\delta n}}{{\delta t}}} \right) = - \frac{1}{q}A\left( {{J_N}(x) - J(x + dx)} \right) - \frac{{\Delta n}}{{{\tau _n}}}Adx

Where

  • Adx(δnδt)A{\rm d}x\left(\frac{\delta n}{\delta t}\right) is the changing rate of total electron number within the volume.
  • 1qA(JN(x)J(x+dx))- \frac{1}{q}A\left( {{J_N}(x) - J(x + dx)} \right) is the net number of electron flowing into the volume. Notice an electron carries q-q of charge.
  • ΔnτnAdx\frac{{\Delta n}}{{{\tau _n}}}Adx is the relaxation rate of excess electrons.

With:

JN(x+dx)=JN(x)+δJN(x)δxdx{J_N}(x + dx) = {J_N}(x) + \frac{{\delta {J_N}(x)}}{{\delta x}}dx

It is derived that

δnδt=1qδJN(x)δxΔnτn\frac{{\delta n}}{{\delta t}} = \frac{1}{q}\frac{{\delta {J_N}(x)}}{{\delta x}} - \frac{{\Delta n}}{{{\tau _n}}}

Taking the generation rate GLG_L into consideration:

δnδt=1qδJN(x)δxΔnτn+GL\frac{{\delta n}}{{\delta t}} = \frac{1}{q}\frac{{\delta {J_N}(x)}}{{\delta x}} - \frac{{\Delta n}}{{{\tau _n}}} + {G_L}

δpδt=1qδJP(x)δxΔpτp+GL\frac{{\delta p}}{{\delta t}} = -\frac{1}{q}\frac{{\delta {J_P}(x)}}{{\delta x}} - \frac{{\Delta p}}{{{\tau _p}}} + {G_L}

Minority Carrier Diffusion Equation#

It is basically a special form of the continuity equations, assuming:

  1. The electric field is small, so current is dominant by diffusion.
  2. Uniform doping.
  3. Low-level injection, which means the excess carriers are negligible compared to the majority.

JNqDNδnδx{J_N} \cong q{D_N}\frac{{\delta n}}{{\delta x}}

So

δnδt=1qδδx(qDNδnδx)Δnτn+GL{{\delta n} \over {\delta t}} = {1 \over q}{\delta \over {\delta x}}\left( {q{D_N}{{\delta n} \over {\delta x}}} \right) - {{\Delta n} \over {{\tau _n}}} + {G_L}

nn consists of the equilibrium n0n_0 and excess Δn\Delta n, and n0n_0 is irrelevant to tt:

δ(n0+Δn)δt=1qδδx(qDNδ(n0+Δn)δx)Δnτn+GL{{\delta \left( {{n_0} + \Delta n} \right)} \over {\delta t}} = {1 \over q}{\delta \over {\delta x}}\left( {q{D_N}{{\delta \left( {{n_0} + \Delta n} \right)} \over {\delta x}}} \right) - {{\Delta n} \over {{\tau _n}}} + {G_L}

δΔnpδt=DNδ2Δnpδx2Δnpτn+GL{{\delta \Delta n_p} \over {\delta t}} = {D_N}{{{\delta ^2}\Delta n_p} \over {\delta {x^2}}} - {{\Delta n_p} \over {{\tau _n}}} + {G_L}

Where npn_p means that nn in the equation is the minority carrier in p-type semiconductor.

At special cases the equation can be simplified:

  • Steady state: δΔnpδt=0\frac{\delta \Delta n_p}{\delta t} = 0, meaning the concentration of excess electron becomes stable, such as the injection rate of net current and the recombination rate cancels out.
  • No diffusion current: DNδ2Δnpδx2=0{D_N}{{{\delta ^2}\Delta n_p} \over {\delta {x^2}}} = 0. WHY ??
  • No R-G: Δnτn=0\frac{\Delta n}{\tau_n} = 0.
  • No light: GL=0G_L = 0. What about other generation process?.

In a special (yet common) case that minority holes are injected at x=0 and there is no light absorption, when the system reaches steady state:

0=DPδ2Δpnδx2Δpnτp0 = {D_P}{{{\delta ^2}\Delta {p_n}} \over {\delta {x^2}}} - {{\Delta {p_n}} \over {{\tau _p}}}

δ2Δpnδx2=ΔpnDPτp\therefore {{{\delta ^2}\Delta {p_n}} \over {\delta {x^2}}} = {{\Delta {p_n}} \over {{D_P}{\tau _p}}}

  • LPDPτpL_P \equiv \sqrt{D_P \tau_p} is the hole diffusion length, it is the average distance that a minority carrier diffuses before it recombines with a majority carrier.

Set the boundary conditions as Δpn(0)=Δpn0\Delta p_n(0) = \Delta p_{n0}, and Δpn()=0\Delta p_n(\infty)=0, the equation has a solution:

Δpn(x)=Δpn0exLP\Delta {p_n}(x) = \Delta {p_{n0}}{e^{ - {x \over {{L_P}}}}}

Quasi-Fermi Levels#

EFNE_{FN} and EFPE_{FP} are defined to preserve the appearance of n=nieEFEikTn=n_i e^{\frac{E_F-E_i}{kT}}.

n=nieEFNEikTFNEi+kTln(nni)n=n_i e^{\frac{E_{FN}-E_i}{kT}} \qquad F_N \equiv E_i + kTln\left(\frac{n}{n_i}\right)

p=nieEiEFPkTFPEikTln(pni)p=n_i e^{\frac{E_i-E_{FP}}{kT}} \qquad F_P \equiv E_i - kTln\left(\frac{p}{n_i}\right)